| Customization: | Available |
|---|---|
| After-sales Service: | 1 Year |
| Warranty: | 1 Year |
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Measurement example
Product introduction:
GIEZHY has introduced a non-contact thickness measuring instrument TH-20A, which uses a spectral confocal displacement sensor, a high precision operating table and a high resolution of up to nanometers. It can measure the thickness of mobile phone glass, film, white and transparent workpiece stably and accurately.
Spectral film thickness gauges are based on the principle of thin-film interference, a physical phenomenon in which light waves reflected from the upper and lower surfaces of a film interfere with each other, creating an interference of light that strengthens or weakens the reflected light. When white light, composed of a set of wavelengths, is incident on the film, certain wavelengths (colors) of light are enhanced while others are attenuated.
The interferogram produced by mixing two wavefronts is analyzed spectrographically to calculate the difference in their respective optical paths. When measuring thickness, two waves are generated by reflection from two faces of the transparent sample. In this case, the optical path difference is proportional to the thickness of the sample. The interference signal is a frequency spectrum. According to the phase of the spectrum of the signal, the sample thickness (or air layer gap) is calculated.
Main application:
PCB board coatings, semiconductor (silicon, monocrystalline silicon, polysilicon), semiconductor compounds, MEMS, oxides/nitrides, photoresist, hard coatings, polymer coatings, polymer polymers
Product advantage:
Non-contact measurement, dry and wet conditions can be.
Super high resolution, up to danami level.
One key automatic measurement, automatic identification of glass, film thickness.
Transparent interlayers such as glass and film can be stably measured.
Technical parameter:
1,Probe 1: spectral confocal sensor probe
| Sensor z-axis range | ±550um The range is optional |
| Sensor resolution | 0.01um |
| Accuracy | ±0.3um |
| Minimum measuring thickness | 22 um |
| Maximum measuring thickness | 1694 um |
| Repeatability | <1μm |
| Probe operating distance | 12.7mm |
| light spot size | 12um |
| Lighting | Blue laser excites wide spectrum white light |
| Range (measureable thickness) | 0.5-50um |
| Working distance | 35mm |
| Angle | ±5° |
| Spot size | 0.1mm |
| Accuracy | ±0.3μm |
| Resolution | 0.01μm |
| Measured velocity | 1000-2000 times /s |
.Field use
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